Zimmermann, F.
[Author];
Gärtner, G.
[Author];
Sträter, H.
[Author];
Röder, C.
[Author];
Barchuk, M.
[Author];
Bastin, D.
[Author];
Hofmann, P.
[Author];
Krupinski, M.
[Author];
Mikolajick, T.
[Author];
Heitmann, J.
[Author];
Beyer, F. C.
[Author]
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College Park, MD : American Physical Society, 2010
Published in:Physical Review B 81 (2010), Nr. 12
Schmult, Stefan
[Author];
Solovyev, Victor V.
[Author];
Wirth, Steffen
[Author];
Großer, Andreas
[Author];
Mikolajick, Thomas
[Author];
Kukushkin, Igor V.
[Author]
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IOP Publishing, 2014
Published in:Semiconductor Science and Technology
Tapajna, M.;
Killat, N.;
Moereke, J.;
Paskova, T.;
Evans, K. R.;
Leach, J.;
Li, X.;
Ozgur, Ü.;
Morkoc, H.;
Chabak, K. D.;
Crespo, A.;
Gillespie, J. K.;
Fitch, R.;
Kossler, M.;
Walker, D. E.;
Trejo, M.;
Via, G. D.;
Blevins, J. D.;
Kuball, M.
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Institute of Electrical and Electronics Engineers (IEEE), 2012
Published in:IEEE Electron Device Letters
Killat, N.;
Montes, M.;
Pomeroy, J. W.;
Paskova, T.;
Evans, K. R.;
Leach, J.;
Li, X.;
Ozgur, U.;
Morkoc, H.;
Chabak, K. D.;
Crespo, A.;
Gillespie, J. K.;
Fitch, R.;
Kossler, M.;
Walker, D. E.;
Trejo, M.;
Via, G. D.;
Blevins, J. D.;
Kuball, M.
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Wiley, 2005
Published in:physica status solidi (c)
Asif Khan, M.;
Yang, J. W.;
Knap, W.;
Frayssinet, E.;
Hu, X.;
Simin, G.;
Prystawko, P.;
Leszczynski, M.;
Grzegory, I.;
Porowski, S.;
Gaska, R.;
Shur, M. S.;
Beaumont, B.;
Teisseire, M.;
Neu, G.