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Welberry, Thomas R. [Author]

Diffuse x-ray scattering and models of disorder - [Second edition]

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Oxford: Oxford University Press, [2022]

Published in: Internationale Union für Kristallographie: IUCr monographs on crystallography ; 31
Spieß, Lothar [Author]; Teichert, Gerd [Author]; Schwarzer, Robert [Author]; Behnken, Herfried [Author]; Genzel, Christoph [Author]

Moderne Röntgenbeugung : Röntgendiffraktometrie für Materialwissenschaftler, Physiker und Chemiker - [3., überarbeitete Auflage]

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Wiesbaden; [Heidelberg]: Springer Spektrum, [2019]
Goldstein, Joseph [Author]; Newbury, Dale E. [Author]; Michael, Joseph R. [Author]; Ritchie, Nicholas W. M. [Author]; Scott, John Henry J. [Author]; Joy, David C. [Author]

Scanning electron microscopy and X-ray microanalysis - [Fourth edition]

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New York, NY, U.S.A.: Springer, [2018]
Egerton, Ray [Author]

Physical principles of electron microscopy : an introduction to TEM, SEM and AEM - [Second edition]

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[Cham]: Springer Interantional Publishing, [2016]
Carter, C. Barry [Editor]; Williams, David B. [Editor]; Thomas, John M. [Writer of preface]

Transmission electron microscopy : diffraction, imaging, and spectrometry

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[Cham, Switzerland]: Springer, [2016]
Schnohr, Claudia S. [Editor]

X-ray absorption spectroscopy of semiconductors

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Berlin; Heidelberg [u.a.]: Springer, 2015

Published in: Springer series in optical sciences ; 190
Zolotoyabko, Emil [Author]

Basic concepts of X-ray diffraction

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Weinheim: Wiley-VCH Verlag GmbH & Co. KGaA, [2014]
Luger, Peter [Author]

Modern X-ray analysis on single crystals : a practical guide - [2. ed., fully rev. and extended]

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Berlin [u.a.]: de Gruyter, 2014
Patterson, Bruce D. [Other] ; Paul Scherrer Institut Abteilung für Strahlenschutz und Sicherheit

Time-resolved x-ray spectroscopy : mapping electron flow in matter with the ATHOS beamline at SwissFEL

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Villigen: Paul Scherrer Institut, 2014

Published in: Paul Scherrer Institut: PSI-Bericht ; 2014,01
Gubicza, Jenö [Author]

X-ray line profile analysis in materials science

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Hershey, Pa.: Engineering Science Reference/IGI Globa, 2014

Published in: Research essentials
Svergun, Dmitri I. [Editor]; Koch, Michel H. J. [Other]; Timmins, Peter A. [Other]; May, Roland P. [Other]

Small angle x-ray and neutron scattering from solutions of biological macromolecules - [1. ed.]

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Oxford: Oxford University Press, 2013

Published in: Texts on crystallography ; 19
Ladd, M. F. C. [Author]; Palmer, Rex A. [Author]

Structure determination by X-ray crystallography : analysis by X-rays and neutrons ; celebrating the Centenary of X-Ray Crystallography - [5. ed.]

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New York; Heidelberg [u.a.]: Springer, 2013

Published in: Chemistry
Erni, Rolf [Author]

Aberration-corrected imaging in transmission electron microscopy : an introduction

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London: Imperial College Pr., 2010
Glusker, Jenny P. [Author]; Glusker, Jenny Pickworth [Author]; Trueblood, Kenneth N. [Author]

Crystal structure analysis : a primer - [3. ed.]

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Oxford [u.a.]: Oxford Univ. Press, 2010

Published in: Texts on crystallography ; 14
Welberry, Thomas R. [Author] ; Welberry, T. R. [Other] International Union of Crystallography

Diffuse x-ray scattering and models of disorder - [1. publ. in paperback]

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Oxford [u.a.]: Oxford University Press, 2010

Published in: Internationale Union für Kristallographie: IUCr monographs on crystallography ; 16,2010
Peng, Lian-Mao [Author]; Dudarev, Sergej L. [Author]; Whelan, M. J. [Author]

High-energy electron diffraction and microscopy - [Repr.]

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Oxford: Oxford University Press, 2010

Published in: Monographs on the physics and chemistry of materials ; 61,2010
Bunker, Grant [Author]

Introduction to XAFS : a practical guide to X-ray absorption fine structure spectroscopy

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Cambridge [u.a.]: Cambridge Univ. Press, 2010
Shimizu, Kenichi [Author]; Mitani, Tomoaki [Author]

New horizons of applied scanning electron microscopy

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Berlin; Heidelberg [u.a.]: Springer, 2010

Published in: Springer series in surface sciences ; 45
Linck, Martin [Author]

Off-axis Holografie im aberrationskorrigierten Transmissionselektronenmikroskop

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2010
Soukup, Rudolf Werner [Author]

Paracelsus und die Röntgendiffraktometrie : archäometrische Nachweise für die Herstellung paracelsischer Präparate in einem Laboratorium des 16. Jahrhunderts

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2010

Published in: Praxis der Naturwissenschaften - Chemie in der Schule ; 59(2010), 5, Seite 12-16

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