Goldstein, Joseph
[Author];
Newbury, Dale E.
[Author];
Michael, Joseph R.
[Author];
Ritchie, Nicholas W. M.
[Author];
Scott, John Henry J.
[Author];
Joy, David C.
[Author]
Scanning electron microscopy and X-ray microanalysis
- [Fourth edition]
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Media type:
Book
Title:
Scanning electron microscopy and X-ray microanalysis
Other titles:
Abkürzungstitel: SEMXM
Auf dem Buchdeckel: Extras online
Contains:
Electron beam-specimen interactions -- Backscattered electrons -- Secondary electrons -- X-rays -- SEM instrumentation -- Image formation -- SEM image interpretation -- The visibility of features in SEM images -- Image defects -- High resolution imaging -- Low beam energy SEM -- Variable pressure SEM (VPSEM) -- ImageJ and Fiji -- SEM imaging checklist -- SEM case studies -- Energy dispersive X-ray spectrometry -- DTSA-II EDS software -- Qualitative elemental analysis by energy dispersive X-ray spectrometry -- Quantitative analysis -- Trace analysis by SEM/EDS -- Low beam energy X-ray microanalysis -- Analysis of specimens with special geometry -- Compositional mapping -- Attempting electron-excited X-ray microanalysis in the variable pressure scanning electron microscope (VPSEM) -- Energy dispersive X-ray microanalysis checklist -- Case studies -- Cathodoluminescence -- Characterizing crystalline materials in the SEM -- Focused ion beam application in the SEM laboratory -- Ion beam microscopy