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  7. Chen, John C. [Editor]; Altobelli, S. [Other] ; American Institute of Chemical Engineers

    Developments in fluidization and fluid particle systems : [ten session at the AIChE annual meeting in San Francisco, California, November 13, through 18, 1994]

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    New York, NY: American Institute of Chemical Engineers, 1995

    Published in: American Institute of Chemical Engineers: AIChE symposium series ; 308

  13. Chen, Bo [Editor]; Paterson, Michael S. [Other]; Zhang, Guochuan [Other] ; ESCAPE 1 2007 Hangzhou

    Combinatorics, algorithms, probabilistic and experimental methodologies : first international symposium, ESCAPE 2007, Hangzhou, China, April 7-9, 2007 ; revised selected papers

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    Berlin; Heidelberg [u.a.]: Springer, 2007

    Published in: Lecture notes in computer science ; 4614

  17. Chen, Peter P. [Other] ; Symposium on Conceptual Modeling 1997 Los Angeles, Calif

    Conceptual modeling : current issues and future directions ; [collection of selected papers presented at the Symposium on Conceptual Modeling, which was held in Los Angeles, California, on December 2, 1997]

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    Berlin; Heidelberg [u.a.]: Springer, 1999

    Published in: Lecture notes in computer science ; 1565

  19. Chen, William T. [Editor] ; American Society of Mechanical Engineers, American Society of Mechanical Engineers Applied Mechanics Division, International Mechanical Engineering Congress and Exposition 1997 Dallas, Tex, Symposium on Application of Fracture Mechanics in Electronic Packaging 1997 Dallas, Tex

    Application of fracture mechanics in electronic packaging : [contains 23 technical papers that were presented at the Symposium on Application of Fracture Mechanics in Electronic Packaging] ; presented at the 1997 ASME International Mechanical Engineering Congress and Exposition, November 16-21, 1997, Dallas, Texas

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    New York, NY: American Soc. of Mechanical Engineers, 1997

    Published in: American Society of Mechanical Engineers: AMD / American Society of Mechanical Engineers, Applied Mechanics Division ; 22200 - EEP ; 2000