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Janssens, Koenraad G. F. [Other]

Computational materials engineering : an introduction to microstructure evolution

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Amsterdam; Heidelberg [u.a.]: Academic Press, 2007
Kursun, Elif Cansu [Author]; Supreeti, Shraddha [Author]; Janssens, Koenraad G. F. [Author]; Schift, Helmut [Author]; Spätig, Philippe [Author]

High optical contrast nanoimprinted speckle patterns for digital image correlation analysis

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2022

Published in: Micro and nano engineering ; 17(2022) vom: Nov., Artikel-ID 100164, Seite 1-9
Janssens, Koenraad G F

Random grid, three-dimensional, space-time coupled cellular automata for the simulation of recrystallization and grain growth

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IOP Publishing, 2003

Published in: Modelling and Simulation in Materials Science and Engineering, 11 (2003) 2, Seite 157-171
Janssens, Koenraad G.F.; Holm, Elizabeth A.; Foiles, Stephen M.

Introducing Solute Drag in Irregular Cellular Automata Modeling of Grain Growth

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Trans Tech Publications, Ltd., 2004

Published in: Materials Science Forum, 467-470 (2004), Seite 1045-1050
Janssens, Koenraad G. F.; Vanhellemont, Jan; van der Biest, Omer

A new software package for interpreting electron diffraction contrast images of arbitrary displacement fields: SIMCON

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Wiley, 1993

Published in: Microscopy Research and Technique, 25 (1993) 2, Seite 171-172
Ramesh, Mageshwaran; Leber, Hans J.; Janssens, Koenraad G.F.; Diener, Markus; Spolenak, Ralph

Thermomechanical and isothermal fatigue behavior of 347 and 316L austenitic stainless tube and pipe steels

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Elsevier BV, 2011

Published in: International Journal of Fatigue, 33 (2011) 5, Seite 683-691
Janssens, Koenraad G.F.; Van der Biest, Omer; Vanhellemont, Jan; Maes, Herman E.

Assessment of the quantitative characterization of localized strain using electron diffraction contrast imaging

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Elsevier BV, 1997

Published in: Ultramicroscopy, 69 (1997) 3, Seite 151-167
Janssens, Koenraad G. F.; Van der Biest, Omer; Vanhellemont, Jan; Maes, Herman E.; Hull, Robert

Characterization of strain in an advanced semiconductor laser structure with nanometer range resolution using a new algorithm for electron diffraction contrast imaging interpretation

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AIP Publishing, 1995

Published in: Applied Physics Letters, 67 (1995) 11, Seite 1530-1532
Janssens, Koenraad G.F; Vanhellemont, Jan; De Graef, Marc; Van der Biest, Omer

SIMCON: a versatile software package for the simulation of electron diffraction contrast images of arbitrary displacement fields

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Elsevier BV, 1992

Published in: Ultramicroscopy, 45 (1992) 3-4, Seite 323-335
Janssens, Koenraad G. F.; Olmsted, David; Holm, Elizabeth A.; Foiles, Stephen M.; Plimpton, Steven J.; Derlet, Peter M.

Computing the mobility of grain boundaries

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Springer Science and Business Media LLC, 2006

Published in: Nature Materials, 5 (2006) 2, Seite 124-127
Lenaerts, Lisa; Reynhout, Sara; Verbinnen, Iris; Laumonnier, Frédéric; Toutain, Annick; Bonnet-Brilhault, Frédérique; Hoorne, Yana; Joss, Shelagh; Chassevent, Anna K.; Smith-Hicks, Constance; Loeys, Bart; Joset, Pascal; Steindl, Katharina; Rauch, Anita; Mehta, Sarju G.; Chung, Wendy K.; Devriendt, Koenraad; Holder, Susan E.; Jewett, Tamison; Baldwin, Lauren M.; Wilson, William G.; Towner, Shelley; Srivastava, Siddharth; Johnson, Hannah F.; [...]

The broad phenotypic spectrum of PPP2R1A-related neurodevelopmental disorders correlates with the degree of biochemical dysfunction

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Elsevier BV, 2021

Published in: Genetics in Medicine, 23 (2021) 2, Seite 352-362

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