Media type: E-Article Title: SIMCON: a versatile software package for the simulation of electron diffraction contrast images of arbitrary displacement fields Contributor: Janssens, Koenraad G.F; Vanhellemont, Jan; De Graef, Marc; Van der Biest, Omer Published: Elsevier BV, 1992 Published in: Ultramicroscopy, 45 (1992) 3-4, Seite 323-335 Language: English DOI: 10.1016/0304-3991(92)90143-8 ISSN: 0304-3991 Keywords: Instrumentation ; Atomic and Molecular Physics, and Optics ; Electronic, Optical and Magnetic Materials Origination: Footnote: