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Lifshin, Eric [Other]

Materials science and technology / 2a/2b, Characterization of materials / vol. ed. E. Lifshin - [The classic softcover ed.]

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Weinheim: Wiley-VCH, 2005

Published in: Materials science and technology / ed. by Robert W. Cahn ... ; 2a/2b
Lifshin, Eric [Editor]

X-ray characterization of materials

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Weinheim [u.a.]: Wiley-VCH, 1999
Lifshin, Eric [Editor]

Characterization of materials

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Weinheim [u.a.]: VCH, 1992-

Published in: Materials science and technology ; 2
Cahn, Robert W. [Editor]; Lifshin, Eric [Other]

Concise encyclopedia of materials characterization - [1. ed.]

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Oxford [u.a.]: Pergamon Press, 1993

Published in: Advances in materials science and engineering
Wells, Oliver C. [Author] ; Boyde, Alan [Other]; Lifshin, Eric [Other]; Rezanowich, Alex [Other]

Scanning electron microscopy

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New York, NY [u.a.]: McGraw-Hill, 1974
Goldstein, Joseph [Other]; Newbury, Dale E. [Other]; Echlin, Patrick [Other]; Joy, David C. [Other]; Fiori, charles [Other]; Lifshin, Eric [Other]

Scanning electron microscopy and x-ray microanalysis : a text for biologists, materials scientists, and geologists - [2. print]

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New York [u.a.]: Plenum Press, 1984
Lyman, Charles E. [Editor]; Newbury, Dale E. [Other]; Goldstein, Joseph [Other]; Williams, David B. [Other]; Romig, Alton D. Jr [Other]; Armstrong, John T. [Other]; Echlin, Patrick [Other]; Fiori, Charles E. [Other]; Joy, David C. [Other]; Lifshin, Eric [Other]; Peters, Klaus-Ruediger [Other]

Scanning electron microscopy, X-ray microanalysis, and analytical electron microscopy : a laboratory workbook

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New York [u.a.]: Plenum Press, 1990
Lifshin, Eric

Electron Microprobe Analysis. S. J. B. Reed, Cambridge University Press, 1975. 400 pp. $34.50

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Wiley, 1977

Published in: X-Ray Spectrometry, 6 (1977) 2
Lifshin, Eric; Gauvin, Raynald

Precision and Detection Limits for EDS Analysis in the SEM

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Oxford University Press (OUP), 2003

Published in: Microscopy Today, 11 (2003) 5, Seite 46-49
Gauvin, Raynald; Lifshin, Eric

X-Ray Microanalysis of Real Materials Using Monte Carlo Simulations

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Springer Science and Business Media LLC, 2004

Published in: Microchimica Acta, 145 (2004) 1-4, Seite 41-47
Gauvin, Raynald; Lifshin, Eric

Simulation of X-Ray Emission from Rough Surfaces

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Springer Science and Business Media LLC, 2000

Published in: Microchimica Acta, 132 (2000) 2-4, Seite 201-204
Zotta, Matthew D.; Lifshin, Eric

Scanning Electron Microscope Point Spread Function Determination Through the Use of Particle Dispersions

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Oxford University Press (OUP), 2017

Published in: Microscopy and Microanalysis, 23 (2017) S1, Seite 124-125
Burrell, Michael C.; Lifshin, Eric

Two minds on the solid surface

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Springer Science and Business Media LLC, 1987

Published in: Nature, 325 (1987) 6099, Seite 24-24
Phillips, Victor A.; Lifshin, Eric

Structural Characterization of Materials by Use of Electron Microscopy and Spectroscopy

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Annual Reviews, 1971

Published in: Annual Review of Materials Science, 1 (1971) 1, Seite 1-92
Rizzolo, Michael; Lifshin, Eric; Dunn, Kathleen

Multilayer Electrochemically Deposited Copper Structures for Impurity Diffusion Analysis

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The Electrochemical Society, 2012

Published in: ECS Meeting Abstracts, MA2012-01 (2012) 25, Seite 1008-1008
Lifshin, Eric; Zotta, Matthew; Frey, David; Lifshin, Sarah; Nevins, Mandy; Moskin, Jeffrey

A Software Approach to Improving SEM Resolution, Image Quality, and Productivity

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Oxford University Press (OUP), 2017

Published in: Microscopy Today, 25 (2017) 3, Seite 18-25
Nevins, Mandy C.; Quoi, Kathryn; Hailstone, Richard K.; Lifshin, Eric

Exploring the Parameter Space of Point Spread Function Determination for the Scanning Electron Microscope—Part I: Effect on the Point Spread Function

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Oxford University Press (OUP), 2019

Published in: Microscopy and Microanalysis, 25 (2019) 5, Seite 1167-1182
Nevins, Mandy C.; Hailstone, Richard K.; Lifshin, Eric

Exploring the Parameter Space of Point Spread Function Determination for the Scanning Electron Microscope—Part II: Effect on Image Restoration Quality

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Oxford University Press (OUP), 2019

Published in: Microscopy and Microanalysis, 25 (2019) 5, Seite 1183-1194
Zotta, Matthew D.; Han, Yukun; Bergkoetter, Matthew D.; Lifshin, Eric

An Evaluation of Image Quality Metrics for Scanning Electron Microscopy

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Oxford University Press (OUP), 2016

Published in: Microscopy and Microanalysis, 22 (2016) S3, Seite 572-573
Lifshin, Eric; Kande, Yudhishthir P.; Moore, Richard L.; Lyu, Siwei

Improved SEM Image Resolution Through the Use of Image Restoration Techniques

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Oxford University Press (OUP), 2014

Published in: Microscopy and Microanalysis, 20 (2014) S3, Seite 12-13

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