Media type: Book Title: Scanning electron microscopy and x-ray microanalysis : a text for biologists, materials scientists, and geologists Contributor: Goldstein, Joseph [Other]; Newbury, Dale E. [Other]; Echlin, Patrick [Other]; Joy, David C. [Other]; Fiori, charles [Other]; Lifshin, Eric [Other]; Goldstein, Joseph [Other] Published: New York [u.a.]: Plenum Press, 1984 Issue: 2. print Extent: XIII, 673 S; zahlr. Ill., graph. Darst Language: English ISBN: 030640768X RVK notation: UH 6400 : Radiographie, Mikroradiographie, Röntgenoptik allgemein UH 6300 : Transmissionselektronenmikroskopie insgesamt, Allgemeines UH 6310 : Sekundärelektronen-Rasterelektronenmikroskopie einschließlich Elektronenstrahlmikroanalyse insgesamt, Allgemeines Keywords: Rasterelektronenmikroskopie Elektronenstrahlmikroanalyse Rasterelektronenmikroskopie > Röntgenstrukturanalyse Raster-Transmissions-Elektronenmikroskopie Origination: Footnote: Literaturverz. S. 649-664
Central Library – stack Shelf-mark: 86 8 00163 000 02 0 1 Item ID: 30537957 Status: Loanable, place order > Ordering possible ‒ please log in Orders received from Mon - Fri by 1 pm are expected to be ready for you on the same day.