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Röseler, Arnulf [Author]

Infrared spectroscopic ellipsometry

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Berlin: Akademie-Verl., 1990
Fujiwara, Hiroyuki [Author]

Spectroscopic ellipsometry : principles and applications

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Chichester [u.a.]: Wiley, 2007
Fujiwara, Hiroyuki [Author]

Spectroscopic ellipsometry : principles and applications - [Printed with corrections]

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Chichester: Wiley, 2009
Usov, Denys [Author]

Switching of surface composition and morphology of binary polymer brushes

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2004
Heinemeyer, Ute [Author]

Optical properties of organic semiconductor thin films : static spectra and real-time growth studies

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https://d-nb.info/996042628/34

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http://tobias-lib.ub.uni-tuebingen.de/volltexte/2009/4122/

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Heinemeyer, Ute [Author]

Optical properties of organic semiconductor thin films : static spectra and real-time growth studies

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2009
Gordan, Ovidiu Dorin [Author]

Molecular orientation and electronic interactions in organic thin films studied by spectroscopic ellipsometry

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2006
Pröpper, Daniel Christopher [Author]

Spectroscopic ellipsometry of iridium oxides and iron pnictides

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Stuttgart: Universitätsbibliothek der Universität Stuttgart, 2014
Vinodh, M. S. [Author]

On the initial oxidation of MgAl alloys

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Stuttgart: Max-Planck-Institut für Metallforschung, 2006 ; Online-Ausg., Stuttgart: Universitätsbibliothek der Universität Stuttgart

Published in: Max-Planck-Institut für Metallforschung: Bericht ; 182
Lyapin, Andrey [Author]

The initial stages of the oxidation of zirconium

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https://edocs.tib.eu/files/e01dd10/53962554X.pdf

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Stuttgart: Max-Planck-Inst. für Metallforschung, 2005

Published in: Max-Planck-Institut für Metallforschung: Bericht ; 169
Himcinschi, Cameliu Constantin [Author]

Characterisation of Si-Si bonded wafers and low-k silica xerogel films by means of optical spectroscopies

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https://d-nb.info/968789633/34

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Patzner, Patrik [Author]

Echtzeitanalyse des photoinduzierten Wachstums von Siliziumoxid mittels spektroskopischer Ellipsometrie und FTIR-Spektroskopie

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https://d-nb.info/974008524/34

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http://archiv.ub.uni-heidelberg.de/volltextserver/volltexte/2005/5265/index.html

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Salingue, Nils [Author]

Chemie, Spektroskopie und Massenspektrometrie von silylierten, halogenierten und methylierten Siliziumoberflächen

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2009
Pröpper, Daniel Christopher [Author] ; Keimer, Bernhard [Degree supervisor]

Spectroscopic ellipsometry of iridium oxides and iron pnictides

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https://d-nb.info/1060047403/34

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Stuttgart: Universitätsbibliothek der Universität Stuttgart, 2014
Salingue, Nils [Author]

Chemie, Spektroskopie und Massenspektrometrie von silylierten, halogenierten und methylierten Siliziumoberflächen

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https://d-nb.info/999935828/34

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Online-Ausg.:: 2010, [2010]
Fronk, Michael [Author]

Charakterisierung von dia-, para- und ferromagnetischen dünnen Schichten mittels magnetooptischer Kerr-Effekt-Spektroskopie

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https://d-nb.info/1010392050/34

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Rogowsky, Stephan [Author]

Konzeption und Charakterisierung von Rippenwellenleiterlasern auf Si-Substrat basierend auf dem gitterangepassten Ga(NAsP)/(B)GaP-Materialsystem

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Stuttgart: Fraunhofer-Verl., 2012

Published in: Science for systems ; 5,onl
Bräuer, Björn [Author] ; Lang, Heinrich [Degree supervisor]; Salvan, Georgeta [Degree supervisor]; Powell, Annie K. [Reviewer] Technische Universität Chemnitz

Synthesis of bis(oxamato) transition metal complexes and Ni nanoparticles and their structural, magnetic, optical, and magneto-optical characterization

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Links

https://nbn-resolving.org/urn:nbn:de:bsz:ch1-200800928

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[2008]
Fujiwara, Hiroyuki [Author]

Spectroscopic ellipsometry : principles and applications

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https://onlinelibrary.wiley.com/doi/book/10.1002/9780470060193

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Chichester, England; Hoboken, NJ: John Wiley & Sons, ©2007
Pflug, Theo [Author] ; Technische Universität Chemnitz

Strong field excitation of electrons into localized states of fused silica

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Chemnitz, 2022

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