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Bullis, W. Murray [Editor] ; Symposium on Defects in Silicon 2 1991 Washington, DC

Defects in Silicon II : proceedings of the Second Symposium on Defects in Silicon; [held at the Washington, DC, May 5 - 10, 1991]

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Pennington, NJ: Electrochemical Society, 1991

Published in: Electrochemical Society: Proceedings volume ; 91,9
Bullis, W. Murray [Editor]

Defects in Silicon : proceedings of the Symposium on Defects in Silicon

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Pennington, NJ: Electrochemical Society, 1983

Published in: Electrochemical Society: Proceedings volume ; 83,9
Bullis, W. Murray [Editor]

Methods of measurement for semiconductor materials, process control and devices : quarterly report; July 1 to Sept. 30, 1971

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Washington: National Bureau of Standards, 1972

Published in: USA: National Bureau of Standards technical note ; 717
Bullis, W. Murray [Editor]

Methods of measurement for semiconductor materials, process control and devices : quarterly report; Oct. 1 to Dec. 31, 1971

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Washington: National Bureau of Standards, 1972

Published in: USA: National Bureau of Standards technical note ; 727
Bullis, W. Murray [Editor]

Methods of measurement for semiconductor materials, process control and devices : quarterly report, Oct. 1 to Dec. 31, 1972

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Washington, D.C.: National Bureau of Standards, 1973

Published in: USA: National Bureau of Standards technical note ; 773
Bullis, W. Murray [Editor]

Methods of measurement for semiconductor materials, process control, and devices : quaterly report; April 1 to june 30, 1973

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Washington: National Bureau of Standards, 1973

Published in: USA: National Bureau of Standards technical note ; 806
Bullis, W. Murray [Editor]

Methods of measurement for semiconductor materials, process control, and devices : quaterly report; Jan. 1 to March 31, 1973

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Washington: National Bureau of Standards, 1973

Published in: USA: National Bureau of Standards technical note ; 788
Bullis, W.Murray

Current trends in silicon defect technology

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Elsevier BV, 2000

Published in: Materials Science and Engineering: B
Bullis, W. Murray

An Invited Guest Column: Rambling Thoughts on Change

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The Electrochemical Society, 1995

Published in: The Electrochemical Society Interface
Bullis, W. Murray

Minority Carrier Thermoelectric Cooling

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AIP Publishing, 1963

Published in: Journal of Applied Physics
Bullis, W. Murray

Galvanomagnetic Effects in Oriented Single Crystals ofn-Type Germanium

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American Physical Society (APS), 1958

Published in: Physical Review
Bullis, W. Murray; Strieter, F. J.

Electrical Properties of n-Type Silicon Doped with Gold

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AIP Publishing, 1968

Published in: Journal of Applied Physics
Barlow, David H.; Farchione, Todd J.; Bullis, Jacqueline R.; Gallagher, Matthew W.; Murray-Latin, Heather; Sauer-Zavala, Shannon; Bentley, Kate H.; Thompson-Hollands, Johanna; Conklin, Laren R.; Boswell, James F.; Ametaj, Amantia; Carl, Jenna R.; Boettcher, Hannah T.; Cassiello-Robbins, Clair

The Unified Protocol for Transdiagnostic Treatment of Emotional Disorders Compared With Diagnosis-Specific Protocols for Anxiety Disorders : A Randomized Clinical Trial : A Randomized Clinical Trial

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American Medical Association (AMA), 2017

Published in: JAMA Psychiatry
Giannakopoulou, Olga; Lin, Kuang; Meng, Xiangrui; Su, Mei-Hsin; Kuo, Po-Hsiu; Peterson, Roseann E.; Awasthi, Swapnil; Moscati, Arden; Coleman, Jonathan R. I.; Bass, Nick; Millwood, Iona Y.; Chen, Yiping; Chen, Zhengming; Chen, Hsi-Chung; Lu, Mong-Liang; Huang, Ming-Chyi; Chen, Chun-Hsin; Stahl, Eli A.; Loos, Ruth J. F.; Mullins, Niamh; Ursano, Robert J.; Kessler, Ronald C.; Stein, Murray B.; Sen, Srijan; [...]

The Genetic Architecture of Depression in Individuals of East Asian Ancestry : A Genome-Wide Association Study : A Genome-Wide Association Study

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American Medical Association (AMA), 2021

Published in: JAMA Psychiatry

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