Media type: Book; Conference Proceedings Title: Defects in Silicon II : proceedings of the Second Symposium on Defects in Silicon; [held at the Washington, DC, May 5 - 10, 1991] Contributor: Bullis, W. Murray [Hrsg.] Event: Symposium on Defects in Silicon imprint: Pennington, NJ: Electrochemical Society, 1991 Published in: Electrochemical Society: Proceedings volume ; 91,9 Extent: XI, 692 S.; Ill., graph. Darst Language: English Keywords: Siliciumbauelement > Werkstofffehler Werkstofffehler > Silicium Origination: Footnote: