Skip to contents Tan, Cher Ming [Author]; Gan, Zhenghao [Author]; Li, Wei [Author]; Hou, Yuejin [Author] Applications of finite element methods for reliability studies on ULSI interconnections Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. London; Dordrecht; Heidelberg; New York: Springer, [2011] Published in: Springer Series in Reliability Engineering
Tan, Cher Ming [Author]; Gan, Zhenghao [Author]; Li, Wei [Author]; Hou, Yuejin [Author] Applications of finite element methods for reliability studies on ULSI interconnections Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. London; Dordrecht; Heidelberg; New York: Springer, [2011] Published in: Springer Series in Reliability Engineering
> Location Skip to next facet Departmental Library DrePunct (1) Wert ausschließen Show more show less
> Subject Skip to next facet Mathmatics (1) Wert ausschließen Technology (1) Wert ausschließen Show more show less
> Creator Skip to next facet Gan, Zhenghao (1) Wert ausschließen Hou, Yuejin (1) Wert ausschließen Li, Wei (1) Wert ausschließen Tan, Cher Ming (1) Wert ausschließen Show more show less