Media type: Book Title: Fundamentals of surface and thin film analysis Contributor: Feldman, Leonard C. [Author]; Mayer, James W. [Author] Published: New York, NY [u.a.]: North Holland, 1986 Extent: XVIII, 352 S.; zahlr. graph. Darst Language: English ISBN: 0444009892 RVK notation: UP 7500 : Allgemeines Keywords: Oberflächenanalyse Origination: Footnote:
Departmental Library DrePunct – stack Shelf-mark: 0992 01466 001 Item ID: 30526723 Status: Loanable, place order > Ordering possible ‒ please log in Delivery expected: 1 - 2 days after order
Departmental Library DrePunct – stack Shelf-mark: 0987 00098 001 Item ID: 32270411 Status: Loanable, place order > Ordering possible ‒ please log in Delivery expected: 1 - 2 days after order