Media type: E-Book; Conference Proceedings Title: Proceedings of 2017 IEEE Far East NDT New Technology & Application Forum (FENDT 2017) : June 22-24, 2017, Xi'an, China Other titles: Abweichender Titel: 2017 IEEE Far East Forum on Nondestructive Evaluation/Testing: New Technology & Application (IEEE FENDT 2017) Contributor: Xu, Chunguang [HerausgeberIn] Corporation: Institute of Electrical and Electronics Engineers imprint: [Piscataway, NJ]: IEEE, 2018 Extent: 1 Online-Ressource; Illustrationen Language: English ISBN: 9781538616154 Keywords: Konferenzschrift Origination: Footnote: Literaturangaben