Media type: Book Title: Electron microscopy and microanalysis of metals Contributor: Belk, John A. [Hrsg.] imprint: Amsterdam [u.a.]: Elsevier, 1968 Extent: IX, 254 S.; zahlr. Ill., graph. Darst Language: English RVK notation: UP 2100 : Theorie der Gitterfehler (Versetzungen, Punktdefekte) Keywords: Metall > Elektronenmikroskopie Metall > Mikroanalyse Origination: Footnote:
Central Library – external stack Shelf-mark: 69 8 01011 000 01 0 1 Item ID: 11563660N Status: Loanable, place order > Ordering possible ‒ please log in Delivery expected: 4 - 7 days after order