Media type: Book; Conference Proceedings Title: Machine vision applications in industrial inspection 7, 25 - 26 January 1999, San Jose, California / Kenneth W. Tobin ... chairs/eds Contributor: Tobin, Kenneth W. [Other] Published: Bellingham, Wash., 1999 Published in: Machine vision applications in industrial inspection ; 7 SPIE, The International Society for Optical Engineering: Proceedings ; 3652 Extent: IX, 262 S.; Ill., graph. Darst Language: English ISBN: 0819431230 RVK notation: ST 330 : Bildverarbeitung und Mustererkennung Keywords: Konferenzschrift Origination: Footnote:
Departmental Library DrePunct – stack Shelf-mark: R2017 4 1520 Item ID: 10086723 Status: Loanable, place order > Ordering possible ‒ please log in Delivery expected: 1 - 2 days after order