Media type: Book; Conference Proceedings Title: 2nd European Symposium X-Ray Topography and High Resolution Diffraction : programme and abstracts; Berlin, Germany, 5 - 7 September 1994 Corporation: Humboldt-Universität zu Berlin imprint: Berlin: Humboldt-Univ., [1994] Extent: 213 S.; graph. Darst Language: English RVK notation: UM 2280 : Röntgenspektren, Röntgenstrahlung allgemein Röntgenographie Fluoreszenz s. UH 5870 Phosphoreszenz s. UH 5860 Löschprozesse s. UH 5870 Keywords: Röntgentopographie Origination: Footnote: