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Eichhorn, Klaus-Jochen [Author]

Beiträge zur Anwendung der Ellipsometrie für die Untersuchung von dünnen oxidischen Deckschichten auf Eisen und Stahl in Modellatmosphären

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  • Media type: Book; Thesis
  • Title: Beiträge zur Anwendung der Ellipsometrie für die Untersuchung von dünnen oxidischen Deckschichten auf Eisen und Stahl in Modellatmosphären
  • Contributor: Eichhorn, Klaus-Jochen [Author]
  • imprint: 1985
  • Extent: 144 S.; Ill., graph. Darst
  • Language: German
  • Keywords: Hochschulschrift
  • Origination:
  • University thesis: Dresden, Techn. Univ., Fak. f. Naturwiss. u. Mathematik, Diss., 1985
  • Footnote:

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Central Library – stack

  • Shelf-mark: 22 4 15836 0 1
  • Item ID: 34194493
  • Status: Loanable, place order
Orders received from Mon - Fri by 1 pm are expected to be ready for you on the same day.

Central Library – stack

  • Shelf-mark: 0686 00011 001
  • Item ID: 30800008
  • Status: Place order for use in library, no dispatch by interlibrary loan; delivery of photocopies possible
Orders received from Mon - Fri by 1 pm are expected to be ready for you on the same day.