Description:
X-ray diffraction and reflectivity / Mauro R. Sardela Jr. -- Introduction to optical characterization of materials / Julio A.N.T. Soares -- X-ray photoelectron spectroscopy (XPS) and auger electron spectroscopy (AES) / Richard T. Haasch -- Secondary ion mass spectrometry / Judith E. Baker -- Transmission electron microscopy / Jian Guo Wen