Media type: Book Title: Ion beam analysis : fundamentals and applications Contributor: Nastasi, Michael [Author]; Mayer, James W. [Author]; Wang, Yongqiang [Author] imprint: Boca Raton, Fla. [u.a.]: CRC Press, 2015 Language: English ISBN: 9781439846384; 1439846383 RVK notation: UN 6700 : Spektroskopie von Teilchenstrahlen allgemein Keywords: Ionenstrahlanalyse Ionenstrahlanalyse Origination: Footnote: Includes bibliographical references and index