Media type: Book Title: Reliability wearout mechanisms in advanced CMOS technologies Contributor: Strong, Alvin W. [Other] imprint: Hoboken, N.J.: Wiley [u.a.], 2009 Published in: IEEE Press Series on Microelectronic Systems Extent: XI, 624 S.; Ill., graph. Darst; 25 cm Language: Not determined ISBN: 9780471731726; 0471731722 RVK notation: ZN 4040 : Zuverlässigkeit elektronischer Bauelemente und Geräte Keywords: Metal oxide semiconductors, Complementary ; Reliability Origination: Footnote:
Departmental Library DrePunct – open access area Shelf-mark: ZN 4040 S923 Item ID: 32094490 Status: Loanable