• Media type: E-Book; Conference Proceedings
  • Title: Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings
  • Contributor: Yeung, Dit-Yan [Other]; de Ridder, Dick [Other]; Fred, Ana [Other]; Kwok, James T. [Other]; Roli, Fabio [Other]
  • Published: Berlin, Heidelberg: Springer Berlin Heidelberg, 2006
  • Published in: Lecture notes in computer science ; 4109
    Bücher
  • Extent: Online-Ressource (XXI, 939 p. Also available online, digital)
  • Language: English
  • DOI: 10.1007/11815921
  • ISBN: 9783540372417
  • Identifier:
  • RVK notation: SS 4800 : Lecture notes in computer science
  • Keywords: Mustererkennung
    Mustererkennung
  • Origination:
  • Footnote: Lizenzpflichtig
  • Description: Invited Talks -- SSPR -- Poster Papers -- SPR -- Poster Papers.