Media type: E-Book Title: Penalized logistic regression with low prevalence exposures beyond high dimensional settings Contributor: Doerken, Sam [Author]; Avalos, Marta [Author]; Lagarde, Emmanuel [Author]; Schumacher, Martin [Author] Published: San Francisco, CA: Public Library of Science (PLoS), 2019 Published in: PLOS ONE ; 14, 5 (2019), e0217057 Extent: 1 Online-Ressource (14 Seiten); Diagramme; Supporting information (5 Dateien) Language: English DOI: 10.1371/journal.pone.0217057 Identifier: Origination: Footnote: Access State: Open Access