Media type: E-Article Title: Patent technometry by mind maps : a study on the recycling of waste electrical and electronic equipment Parallel title: Tecnometria em patentes por mapas mentais Contributor: Vanderlei, Celso Arruda [VerfasserIn]; Kniess, Claudia [VerfasserIn]; Quoniam, Luc [VerfasserIn] imprint: 2020 Published in: International journal of innovation ; 8(2020), 1 vom: Jan./Apr., Seite 77-100 Language: English DOI: 10.5585/iji.v8i1.16480 ISSN: 2318-9975 Identifier: Keywords: Aufsatz in Zeitschrift Origination: Footnote: Access State: Open Access