University thesis:
Dissertation, Universität Rostock, 2020
Footnote:
GutachterInnen: Rene Androsch (Martin Luther University Halle-Wittenberg, Interdisciplinary Center for Transfer-oriented Research in Natural Sciences) ; Christoph Schick (University of Rostock, Institution of Physics & Competence Centre CALOR)
Description:
A chip based fast scanning calorimeter (FSC) is used as a fast hot-stage in an atomic force microscope (AFM). This way, the morphology of materials with a resolution from micro to nano meters after fast thermal treatments becomes accessible. FSC provides crystallization/melting curves of the sample just imaged by AFM. A combined AFM-FSC device is described, where the AFM sample holder is replaced by the FSC chip-sensor. The sample can be repeatedly annealed at pre-defined temperatures and times and the AFM images can be taken from exactly the same spot of the sample.<eng>