Media type: E-Article Title: SemML: Reusable ML Models for Condition Monitoring in Discrete Manufacturing Contributor: Svetashova, Yulia [Author]; Zhou, Baifan [Author]; Schmid, Stefan [Author]; Pychynski, Tim [Author]; Kharlamov, Evgeny [Author] Published: 2020 Published in: International Semantic Web Conference (19. : 2020 : Online): ISWC-posters 2020: ISWC 2020 posters, Demos, and Industry tracks ; (2020), Seite 213-218 Language: English Origination: Footnote: Access State: Open Access