Media type: Book Title: Advanced simulation and test methodologies for VLSI design Contributor: Russell, Gordon [Author]; Sayers, Ian L. [Author] imprint: London: Van Nostrand Reinhold (International), 1989 Issue: 1. publ. Extent: XI, 378 S.; Ill., graph. Darst Language: English ISBN: 0747600015 RVK notation: ST 190 : Schaltungskreistechnik (techn.-physik.), Integrierte Schaltung, spez. Schaltkreise, VLSI, TTL, ECL etc. Keywords: VLSI > Prüftechnik Origination: Footnote:
Departmental Library DrePunct – stack Shelf-mark: 0990 00532 001 Item ID: 32545977 Status: Loanable, place order > Ordering possible ‒ please log in