Media type: Book Title: Fractal-based point processes : [an integrated approach to fractals and point processes] Contributor: Lowen, Steven Bradley [Author]; Teich, Malvin Carl [Author] imprint: Hoboken, NJ: Wiley-Interscience, c 2005 Published in: Wiley series in probability and statistics Extent: XXIV, 594 S.; Ill., graph. Darst Language: English ISBN: 0471383767; 9780471383765 RVK notation: SK 820 : Stochastische Prozesse Keywords: Fraktal > Punktprozess Punktprozess > Selbstähnlichkeit > Wahrscheinlichkeitsrechnung Origination: Footnote: Includes bibliographical references and index