Media type: Book; Thesis Title: Copper- and hydrogen-related defects in silicon Contributor: Knack, Steffen [Author] imprint: Berlin: Logos-Verl., 2002 Extent: VI, 110 S; Ill., graph. Darst; 21 cm Language: English ISBN: 3832500847 RVK notation: UQ 2400 : Imperfektionen, Defekte, Wachstumsfehler Keywords: Silicium > Störstelle > Kupfer > Wasserstoff > DLTS Silicium > Störstelle > Kupfer > Wasserstoff > DLTS Origination: University thesis: Zugl.: Dresden, Techn. Univ., Diss., 2002 Footnote:
Central Library – stack Shelf-mark: 2002 8 017444 Item ID: 30905866 Status: Place order for use in library, interlibrary loan possible > Ordering possible ‒ please log in