Menon, Sankaran
[Other]
;
International Workshop on Current and Defect Based Testing 2004 Napa, Calif,
IEEE Computer Society Test Technology Technical Committee
Proceedings / 2004 IEEE International Workshop on Current & Defect Based Testing, DBT 2004
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Media type:
E-Book;
Conference Proceedings
Title:
Proceedings / 2004 IEEE International Workshop on Current & Defect Based Testing, DBT 2004
:
25 April 2004, [Napa Valley Marriott, Napa Valley, CA, USA]