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Park, Nohpill [Other] ; IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Technical Committee on Fault Tolerant Computing

21st [i.e. 19th] IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2006

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  • Media type: E-Book; Conference Proceedings
  • Title: 21st [i.e. 19th] IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2006 : DFT '06 ; October 4 - 6, 2006, Arlington, Virginia, USA ; proceedings
  • Contributor: Park, Nohpill [Other]
  • Corporation: IEEE Computer Society, Test Technology Technical Council ; IEEE Computer Society, Technical Committee on Fault Tolerant Computing
  • imprint: Los Alamitos, Calif. [u.a.]: IEEE Computer Society, 2006
  • Extent: Online-Ressource
  • Language: English
  • ISBN: 076952706X; 9780769527062
  • Keywords: VLSI > Fehlertoleranz
  • Origination:
  • Footnote: Fälschlich als "21st Symposium" gezählt. Auf der Homepage als "9th IEEE Symposium ..." bezeichnet, insgesamt jedoch die 19. Tagung in dieser Konferenzfolge (1998 Namensänderung von "Workshop" zu "Symposium")
    Parallel als Buch-Ausg. erschienen