• Media type: Book
  • Title: Terrestrial neutron-induced soft errors in advanced memory devices
  • Contains: IntroductionTerrestrial neutron spectrometry and dosimetry -- Irradiation testing in the terrestrial field -- Neutron irradiation test facilities -- Review and discussion of experimental data -- Monte Carlo simulation methods -- Simulation results and their implications -- International standardization of the neutron test method -- Summary and challenges.
    Literaturangaben
  • Contributor: Nakamura, Takashi [Other]
  • imprint: New Jersey [u.a.]: World Scientific, 2008
  • Extent: XXII, 343 S.; Ill., graph. Darst
  • Language: English
  • ISBN: 9812778810; 9789812778819
  • RVK notation: UP 2000 : Neutronenphysik, Neutronenspektroskopie
  • Keywords: Semiconductor storage devices ; Soft errors (Computer science) ; Neutron irradiation ; Radiation dosimetry ; Nuclear physics
  • Origination:
  • Footnote:

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  • Status: Loanable