Media type: E-Book; Conference Proceedings Title: IEEE Circuits and Systems International Conference on Testing and Diagnosis, 2009 : ICTD 2009 ; 28 - 29 April 2009, Chengdu, China Contributor: Long, Bing [Other] Corporation: Institute of Electrical and Electronics Engineers ; IEEE Circuits and Systems Society ; Dian zi ke ji da xue imprint: Piscataway, NJ: IEEE, 2009 Extent: Online-Ressource Language: English ISBN: 9781424425860; 1424425875; 9781424425877 Keywords: Computer programs Testing Congresses ; Automatic test equipment Congresses ; Konferenzschrift Origination: Footnote: Parallel als Druckausg. erschienen Description: Testing and Fault Diagnosis for Digital, Analog and Mixed Circuits and Systems