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Bolchini, Christiana [Other] ; IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Technical Committee on Fault Tolerant Computing

IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems, 2008

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  • Media type: E-Book; Conference Proceedings
  • Title: IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems, 2008 : DFTVS '08 ; 1 - 3 Oct. 2008, [Cambridge], Boston, Massachusetts
  • Other titles: Nebent.: Proceedings / The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
  • Contributor: Bolchini, Christiana [Other]
  • Corporation: IEEE Computer Society, Test Technology Technical Council ; IEEE Computer Society, Technical Committee on Fault Tolerant Computing
  • imprint: Piscataway, NJ: IEEE, 2008
  • Extent: Online-Ressource
  • Language: English
  • ISBN: 9780769533650; 0769533655
  • Keywords: VLSI > Fehlertoleranz
  • Origination:
  • Footnote: Fälschlich als "23th Symposium" gezählt. Auf der Homepage als "11th IEEE Symposium ..." bezeichnet, insgesamt jedoch die 21. Tagung in dieser Konferenzfolge (1998 Namensänderung von "Workshop" zu "Symposium")
    Parallel als Druckausg. erschienen