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Gizopoulos, Dimitris [Other] ; IEEE Computer Society Technical Committee on Fault Tolerant Computing, IEEE Computer Society Test Technology Technical Council

24th [i.e. 22nd] IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2009 : DFT '09 ; 7 - 9 Oct. 2009, Chicago, Illinois ; proceedings

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  • Media type: E-Book; Conference Proceedings
  • Title: 24th [i.e. 22nd] IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2009 : DFT '09 ; 7 - 9 Oct. 2009, Chicago, Illinois ; proceedings
  • Contributor: Gizopoulos, Dimitris [Other]
  • Corporation: IEEE Computer Society, Technical Committee on Fault Tolerant Computing ; IEEE Computer Society, Test Technology Technical Council
  • imprint: Piscataway, NJ: IEEE, 2009
  • Extent: Online-Ressource
  • Language: English
  • ISBN: 9781424452989; 0769538398; 9780769538396
  • Keywords: VLSI > Fehlertoleranz
  • Origination:
  • Footnote: Fälschlich als "24th Symposium" gezählt. Auf der Homepage als "12th IEEE Symposium ..." bezeichnet, insgesamt jedoch die 22. Tagung in dieser Konferenzfolge (1998 Namensänderung von "Workshop" zu "Symposium")
    Parallel als Druckausg. erschienen