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Sharma, Ashok K. [Other] ; IEEE Solid-State Circuits Council

Semiconductor memories : technology, testing, and reliability

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  • Media type: E-Book
  • Title: Semiconductor memories : technology, testing, and reliability
  • Contributor: Sharma, Ashok K. [Other]
  • Corporation: IEEE Solid-State Circuits Council
  • imprint: Piscataway, N.J; New York: Institute of Electrical and Electronics Engineers, c1997
    Online-Ausg.: Piscataway, N.J: IEEE, 2010
  • Published in: IEEE Xplore Digital Library
  • Extent: Online Ressource (xii, 462 p.); ill
  • Language: English
  • ISBN: 9780470546406; 0470546409
  • Keywords: Semiconductor storage devices ; Electronic books
  • Type of reproduction: Online-Ausg.
  • Place of reproduction: Piscataway, N.J: IEEE, 2010
  • Reproduction note: Electronic reproduction; Mode of access: World Wide Web
  • Origination:
  • Footnote: "IEEE order number: PC3491"--P. [4] cover. - "IEEE Solid-State Circuits Council, sponsor. - Includes bibliographical references and index. - Description based on print version record
    "IEEE order number: PC3491"--P. [4] cover
    Includes bibliographical references and index