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Chapman, Glenn [Other] ; Institute of Electrical and Electronics Engineers, IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Technical Committee on Fault Tolerant Computing

IEEE 25th [i.e. 23rd] International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT), 2010

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  • Media type: E-Book; Conference Proceedings
  • Title: IEEE 25th [i.e. 23rd] International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT), 2010 : 6 - 8 Oct. 2010, Kyoto, Japan
  • Other titles: Nebent.: Proceedings // 2010 25th International Symposium on Defect and Fault Tolerance in VLSI Systems
  • Contributor: Chapman, Glenn [Other]
  • Corporation: Institute of Electrical and Electronics Engineers ; IEEE Computer Society, Test Technology Technical Council ; IEEE Computer Society, Technical Committee on Fault Tolerant Computing
  • imprint: Piscataway, NJ: IEEE, 2010
  • Extent: Online-Ressource; Ill., graph. Darst
  • Language: English
  • ISBN: 9780769542430; 1424484472; 9781424484478
  • Keywords: VLSI > Fehlertoleranz
  • Origination:
  • Footnote: Literaturangaben
    Fälschlich als "25th Symposium" gezählt. Auf der Homepage als "13th IEEE Symposium ..." bezeichnet, insgesamt jedoch die 23. Tagung in dieser Konferenzfolge (1998 Namensänderung von "Workshop" zu "Symposium")