Institute of Electrical and Electronics Engineers,
IEEE Computer Society,
IEEE Computer Society Technical Committee on Fault Tolerant Computing,
IEEE Computer Society Test Technology Technical Council
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2012
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Media type:
E-Book;
Conference Proceedings
Title:
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2012
:
3 - 5 Oct. 2012, Austin, Texas, U.S.A
Other titles:
Nebent.: Proceedings of the 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Footnote:
Literaturangaben
Auf der Homepage als "15th IEEE Symposium ..." gezählt, insgesamt jedoch die 25. Tagung in dieser Konferenzfolge (1998 Namensänderung von "Workshop" zu "Symposium")