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IEEE Radiation Effects Data Workshop (1992 :New Orleans, La.), IEEE Nuclear and Plasma Sciences Society, IEEE Nuclear and Space Radiation Effects Conference (1992 New Orleans, La.)

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  • Media type: E-Book; Conference Proceedings
  • Title: Workshop record : 1992 IEEE Radiation Effects Data Workshop
  • Other titles: Electronic reproduction has title: Radiation Effects Data Workshop, 1992, workshop record, 1992 IEEE
  • Corporation: IEEE Nuclear and Plasma Sciences Society
  • Event: IEEE Nuclear and Space Radiation Effects Conference
  • imprint: Piscataway, NJ: Institute of Electrical and Electronics Engineers, 2010
    [S.l.]: HathiTrust Digital Library
  • Extent: 1 Online-Ressource (87 pages); illustrations
  • Language: English
  • ISBN: 0780309308; 0780309316; 9780780309302; 9780780309319
  • Keywords: Integrated circuits Effect of radiation on Congresses ; Metal oxide semiconductors, Complementary Effect of radiation on Congresses ; Konferenzschrift
  • Place of reproduction: [S.l.]: HathiTrust Digital Library
  • Reproduction note: Electronic reproduction
  • Origination:
  • Footnote: "IEEE catalog number: 92TH0507-4"--Title page verso
    "Held in conjunction with the IEEE Nuclear and Space Radiation Effects Conference, Hyatt Regency Hotel, July 14, 1992, New Orleans, Louisiana, USA"--Cover
    At head of title on cover: IEEE Nuclear and Plasma Sciences Society, the Institute of Electrical and Electronics Engineers, Inc
    Includes bibliographical references and index
    Use copy Restrictions unspecified star MiAaHDL
    Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002
  • Description: Low Dose Rate Radiation Testing of Advanced CMOS Technology (AC/ACT) Series Parts for Space Flight Applications / A.K. Sharma and K. Sahu -- Radiation Design Test Data for Advanced CMOS Product / M.C. Maher -- 1-[mu]m CMOS Gate Array Radiation Hardened Technology / A.H. Owens, A. Yee, S. Toutounchi, M. Lyu, W.C. Schneider and A.R. Dantas -- QML Qualified 256K Radiation-Hardened CMOS SRAM / R. Brown, J. Damato, N. Haddad, B. Posey, T. Scott, S. Murrill, J. Groseth and S. Mc Gregor -- Radiation Characterization of a Monolithic Nuclear Event Detector / G.L. Hash, J.R. Schwank, M.R. Shaneyfelt, K.L. Hughes, M.P. Connors, J.W. Swonger, N.W. van Vonno and R.L. Martin

    SEU Test of 80386 Based Flight Computer/Data Handling System and of Discrete PROM and EEPROM Devices, and SEL Tests of Discrete 80386, 80387, PROM, EEPROM and ASICs / K. LaBel, E.G. Stassinopoulos, G.J. Brucker and C.A. Stauffer -- A Summary of Recent VLSI SEU and Latch-Up Testing / J.D. Kinnison and R.H. Maurer -- SEU Testing of 32-Bit Microprocessors / R. Velazco, S. Karoui and T. Chapuis -- Heavy Ion Testing using the GANIL Accelerator and Compilation of Results with Predictions / C. Dufour, P. Garnier, J. Beaucour and H. Delagrange -- Heavy Ion Test Results on Memories / R. Ecoffet, M. Labrunee, S. Duzellier and D. Falguere -- Radiation Pre-Screening of R3000/R3000A Microprocessors / R. Harboe-Sorensen and A.T. Sund -- Ionizing Radiation Effects on Commercial 256K EEPROM's / M.E. Bumbaugh and D.S. Rosario -- Total Ionizing Dose Radiation Characterization of the Natel HSRD 1056RH Resolver-to-Digital Converter Hybrid / C.I. Lee, R.E. Hill and K. Nies