Published in:Jülich : Kernforschungsanlage Jülich Zentralbibliothek, Verlag, Berichte der Kernforschungsanlage Jülich 41, p. 502-32 (1962).
Language:
German
Origination:
Footnote:
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Description:
Different methods for determining stacking fault energies from dislocation configurations observed in the electron microscope are discussed. Configurations discussed are simple, threefold, and fourfold ribbons, arrays of many parallel ribbons, and dislocation nodes. The latter are treated taking the mutual interaction of the partials approximately into account. Results are given for measurementsin graphite, MoS$_{2}$, AIN, and talc.