Cooper, David
[Author];
Bernier, Nicolas
[Author];
Baumer, Christoph
[Author];
Dunin-Borkowski, Rafal
[Author];
Dittmann, Regina
[Author]
Direct Observation of Redox Switching in Resistive Memory Devices Operated In-situ in a Transmission Electron Microscope by Electron Energy Loss Spectroscopy and Off-Axis Electron Holography
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Media type:
Electronic Conference Proceeding
Title:
Direct Observation of Redox Switching in Resistive Memory Devices Operated In-situ in a Transmission Electron Microscope by Electron Energy Loss Spectroscopy and Off-Axis Electron Holography
Contributor:
Cooper, David
[Author];
Bernier, Nicolas
[Author];
Baumer, Christoph
[Author];
Dunin-Borkowski, Rafal
[Author];
Dittmann, Regina
[Author]
imprint:
Cambridge University Press, 2016
Published in:Microscopy and microanalysis 22(S5), 52 - 53 (2016). doi:10.1017/S1431927616012289 ; 3rd International Conference on Insitu and Correlative Electron Microscopy, Saarbrücken, Germany, 2016-10-11 - 2016-10-12
Language:
English
DOI:
https://doi.org/10.1017/S1431927616012289
ISSN:
1435-8115;
1431-9276
Origination:
Footnote:
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