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Lanza, Mario [Author]; Waser, R. [Author]; Wiefels, Stefan [Author]; Menzel, Stephan [Author]; Valov, Ilia [Author]; Villena, Marco A. [Author]; Miranda, Enrique [Author]; Jing, Xu [Author]; Campabadal, Francesca [Author]; Gonzalez, Mireia B. [Author]; Aguirre, Fernando [Author]; Palumbo, Felix [Author]; Ielmini, Daniele [Author]; Zhu, Kaichen [Author]; Roldan, Juan Bautista [Author]; Puglisi, Francesco Maria [Author]; Larcher, Luca [Author]; Hou, Tuo-Hung [Author]; Prodromakis, Themis [Author]; Yang, Yuchao [Author]; Huang, Peng [Author]; Wan, Tianqing [Author]; Chai, Yang [Author]; Yang, Jie [Author]; [...]

Standards for the Characterization of Endurance in Resistive Switching Devices

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  • Media type: E-Article
  • Title: Standards for the Characterization of Endurance in Resistive Switching Devices
  • Contributor: Lanza, Mario [Author]; Waser, R. [Author]; Wiefels, Stefan [Author]; Menzel, Stephan [Author]; Valov, Ilia [Author]; Villena, Marco A. [Author]; Miranda, Enrique [Author]; Jing, Xu [Author]; Campabadal, Francesca [Author]; Gonzalez, Mireia B. [Author]; Aguirre, Fernando [Author]; Palumbo, Felix [Author]; Ielmini, Daniele [Author]; Zhu, Kaichen [Author]; Roldan, Juan Bautista [Author]; Puglisi, Francesco Maria [Author]; Larcher, Luca [Author]; Hou, Tuo-Hung [Author]; Prodromakis, Themis [Author]; Yang, Yuchao [Author]; Huang, Peng [Author]; Wan, Tianqing [Author]; Chai, Yang [Author]; Yang, Jie [Author]; [...]
  • imprint: Soc., 2021
  • Published in: ACS nano 15(11), 17214 - 17231 (2021). doi:10.1021/acsnano.1c06980
  • Language: English
  • DOI: https://doi.org/10.1021/acsnano.1c06980
  • ISSN: 1936-0851; 1936-086X
  • Origination:
  • Footnote: Diese Datenquelle enthält auch Bestandsnachweise, die nicht zu einem Volltext führen.
  • Access State: Open Access