Florczak, Josua
[Author];
Neubert, Tom
[Author];
El Maghawry, Khalid
[Author];
Zimmermann, Egon
[Author];
Rongen, Heinz
[Author];
Kaufmann, Martin
[Author];
Olschewski, Friedhelm
[Author];
Van Waasen, Stefan
[Author]
Radiation Monitor Extension for CMOS Imaging Instruments in Nanosatellites
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Media type:
E-Article
Title:
Radiation Monitor Extension for CMOS Imaging Instruments in Nanosatellites
Contributor:
Florczak, Josua
[Author];
Neubert, Tom
[Author];
El Maghawry, Khalid
[Author];
Zimmermann, Egon
[Author];
Rongen, Heinz
[Author];
Kaufmann, Martin
[Author];
Olschewski, Friedhelm
[Author];
Van Waasen, Stefan
[Author]
imprint:
IEEE, 2022
Published in:IEEE transactions on nuclear science 69(7), 1651 - 1658 (2022). doi:10.1109/TNS.2022.3144784
Language:
English
DOI:
https://doi.org/10.1109/TNS.2022.3144784
ISSN:
0018-9499;
1558-1578
Origination:
Footnote:
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