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Züfle, Simon [Author] ; Lemmer, U. [Degree supervisor]

Degradation Analysis and Parameter Extraction of Organic Semiconductor Devices : Investigation by means of Complementary Measurement Techniques combined with Numerical Simulation

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  • Media type: E-Book
  • Title: Degradation Analysis and Parameter Extraction of Organic Semiconductor Devices : Investigation by means of Complementary Measurement Techniques combined with Numerical Simulation
  • Contributor: Züfle, Simon [Author]; Lemmer, U. [Degree supervisor]
  • Published: Karlsruhe: KIT-Bibliothek, 2017
  • Extent: Online-Ressource
  • Language: English
  • Identifier:
  • Keywords: organic solar cells ; OLED ; modeling ; characterization ; degradation ; charge transport
  • Origination:
  • University thesis: Dissertation, Karlsruhe, Karlsruher Institut für Technologie (KIT), 2017
  • Footnote:
  • Access State: Open Access