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Media type:
E-Article
Title:
Combined atomic force microscope and scanning tunneling microscope with high optical access achieving atomic resolution in ambient conditions
Contributor:
Pürckhauer, Korbinian;
Maier, Simon;
Merkel, Anja;
Kirpal, Dominik;
Giessibl, Franz J.
Published:
AIP Publishing, 2020
Published in:
Review of Scientific Instruments, 91 (2020) 8
Language:
English
DOI:
10.1063/5.0013921
ISSN:
0034-6748;
1089-7623
Origination:
Footnote:
Description:
Performing atomic force microscopy (AFM) and scanning tunneling microscopy (STM) with atomic resolution under ambient conditions is challenging due to enhanced noise and thermal drift. We show the design of a compact combined atomic force and scanning tunneling microscope that uses qPlus sensors and discuss the stability and thermal drift. By using a material with a low thermal expansion coefficient, we can perform constant height measurements and achieve atomic resolution in both AFM and STM on various samples. Moreover, the design allows a wide angle optical access to the sensor and the sample that is of interest for combining with optical microscopes or focusing optics with a high numerical aperture.