Description:
A homemade x-ray diffractometer using one-dimensional position sensitive detector (PSD) and well suited to the study of thin epitaxial layer systems is presented. It is shown how PSDs can be advantageously used to allow fast reciprocal space mapping, which is especially interesting when analyzing poor crystalline and defective layers as usually observed with oxides and ceramics films. The quality of the data collected with such a setup and the limitations of PSDs in comparison with the use of analyzer crystals are discussed. In particular, the effects of PSD on angular precision, instrument resolution and corrections that must be applied to raw data are presented.