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Reverdin, Charles; Thais, Frédéric; Loisel, Guillaume; Busquet, M.; Bastiani-Ceccotti, S.; Blenski, T.; Caillaud, T.; Ducret, J. E.; Foelsner, W.; Gilles, D.; Gilleron, F.; Pain, J. C.; Poirier, M.; Serres, F.; Silvert, V.; Soullie, G.; Turck-Chieze, S.; Villette, B.

X-ray grating spectrometer for opacity measurements in the 50 eV to 250 eV spectral range at the LULI 2000 laser facility

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  • Media type: E-Article
  • Title: X-ray grating spectrometer for opacity measurements in the 50 eV to 250 eV spectral range at the LULI 2000 laser facility
  • Contributor: Reverdin, Charles; Thais, Frédéric; Loisel, Guillaume; Busquet, M.; Bastiani-Ceccotti, S.; Blenski, T.; Caillaud, T.; Ducret, J. E.; Foelsner, W.; Gilles, D.; Gilleron, F.; Pain, J. C.; Poirier, M.; Serres, F.; Silvert, V.; Soullie, G.; Turck-Chieze, S.; Villette, B.
  • imprint: AIP Publishing, 2012
  • Published in: Review of Scientific Instruments
  • Language: English
  • DOI: 10.1063/1.4740266
  • ISSN: 0034-6748; 1089-7623
  • Keywords: Instrumentation
  • Origination:
  • Footnote:
  • Description: <jats:p>An x-ray grating spectrometer was built in order to measure opacities in the 50 eV to 250 eV spectral range with an average spectral resolution ⟨E/δE⟩ ∼ 50. It has been used at the LULI-2000 laser facility at École Polytechnique (France) to measure the Δn = 0, n = 3 transitions of several elements with neighboring atomic number: Cr, Fe, Ni, and Cu in the same experimental conditions. Hence a spectrometer with a wide spectral range is required. This spectrometer features one line of sight looking through a heated sample at backlighter emission. It is outfitted with one toroidal condensing mirror and several flat mirrors cutting off higher energy photons. The spectral dispersion is obtained with a flatfield grating. Detection consists of a streak camera sensitive to soft x-ray radiation. Some experimental results showing the performance of this spectrometer are presented.</jats:p>