Media type: E-Article Title: High-resolution real-time X-ray topography of dislocation generation in silicon Contributor: Chang, Shih-Lin; Queisser, Hans-Joachim; Baumgart, Helmut; Hagen, Werner; Hartmann, Werner Published: Informa UK Limited, 1982 Published in: Philosophical Magazine A, 46 (1982) 6, Seite 1009-1013 Language: English DOI: 10.1080/01418618208236946 ISSN: 0141-8610; 1460-6992 Keywords: Metals and Alloys ; Physics and Astronomy (miscellaneous) ; Condensed Matter Physics ; General Materials Science ; Electronic, Optical and Magnetic Materials Origination: Footnote: