Frequency modulated atomic force microscopy on MgO(001) thin films: interpretation of atomic image resolution and distance dependence of tip–sample interaction
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Media type:
E-Article
Title:
Frequency modulated atomic force microscopy on MgO(001) thin films: interpretation of atomic image resolution and distance dependence of tip–sample interaction
Contributor:
Heyde, M;
Sterrer, M;
Rust, H-P;
Freund, H-J