Temperature dependent structural evolution and crystallization properties of thin Ge15Te85 film revealed by in situ resistance, x-ray diffraction and scanning electron microscopic studies

Media type: E-Article
Title: Temperature dependent structural evolution and crystallization properties of thin Ge15Te85 film revealed by in situ resistance, x-ray diffraction and scanning electron microscopic studies
Contributor: Sengottaiyan, Rathinavelu; Saxena, Nishant; Shukla, Krishna Dayal; Manivannan, Anbarasu
imprint: IOP Publishing, 2020
Published in: Journal of Physics D: Applied Physics
Language: Not determined
DOI: 10.1088/1361-6463/ab4e6b
ISSN: 0022-3727; 1361-6463
Keywords: Surfaces, Coatings and Films ; Acoustics and Ultrasonics ; Condensed Matter Physics ; Electronic, Optical and Magnetic Materials
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